Article by Prof. Jurchescu and grad student Jeremy Ward featured on the cover of Advanced Materials

The article entitled "Direct Structural Mapping of Organic Field-Effect Transistors Reveals Bottlenecks to Carrier Transport" by graduate student Jeremy Ward and Prof. Oana Jurchescu is featured on the cover of Advanced Materials Journal. The manuscript demonstrates for the first time spatially-resolved microstructural characterization of the film within the channel of real devices using an X-ray microbeam technique. This insight allows detection of various structural features within the transistor channels and is used to reduce bottlenecks to charge transport in organic semiconductors. The work is a collaboration with King Abdullah University of Science and Technology in Saudi Arabia, Cornell University and University of Kentucky.

With an impact factor of 13.877, Advanced Materials is one of the leading journals in materials research.